New College Graduate - FIB-STEM ELECTRON MICROSCOPY - 157401

Employment Type

: Full-Time


: Miscellaneous

Job Responsibilities * Primary function is processing/imaging STEM samples using FEI 4xx/Helios Dual Beam FIB tools, and TEM sample preparation * Set up, operate, and troubleshoot metrology equipment * Actively participate on developing new technique to expedite sample processing * Provide new learnings and developments to other team members through documentation, presentations, and training sessions * Collaborate with process engineers * Work with process engineers to understand how to best process their samples using metrology equipment * Participate in evaluating new instruments for lab growth * This is a graveyard (3rd) shift position Minimum Qualifications * 2+ years of focused experience in dual beam FIB and SEM operation and TEM sample preparation work experience * M.S with 3+ years of relevant work experience; or Bachelor degree in Material Science, Chemistry, or Physics +5 years of work experience * Must have completed highest degree within 24 months Preferred Qualifications * Extensive knowledge of dual beam focused ion beam technology, and hands-on experience of FEI 4xx/Helios series tools * High level of proficiency and extensive operating experience of Dual Beams desirable * Candidate should possess good written and verbal communication skills to work with large internal customer base * Candidate should be self-motivated, organized and interested in learning Our Commitment We believe it is important for every person to feel valued, included, and empowered to achieve their full potential. By bringing unique individuals and viewpoints together, we achieve extraordinary results. All qualified applicants will receive consideration for employment without regard to race, sex, color, religion, sexual orientation, gender identity, national origin, protected veteran status, or on the basis of disability. We Look Forward to Your Application

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